RobustScan provides a platform for users to pick patented Configurable Soft-Error Resilience (CSER) cells or their preferred SER mitigation cells. First, Soft-Error Rate (SER) analysis is performed. Then it performs automatic robust-scan-cell and hardenedcombinational- cell selection and synthesis. Finally it generates verification testbenches for the final design. RobustScan can be used with scan chains inserted using third-party tools; it can be linked to third-partyís SER analysis programs and is fully compatible with SynTestís existing DFT tools for test, debug, and diagnosis.
DFT- PRO Plus - A Comprehensive Package of DFT Tools view data sheet
DFT-PRO Plus offers an integrated DFT solution covering scan synthesis and ATPG, memory Built-In Self-Test (BIST) synthesis and boundaryscan (BSD) synthesis. The corresponding tools generate RTL blocks that fit seamlessly into an existing synthesis flow. This gives the user the freedom to choose any commercially available logic and scan synthesis tools from vendors like Cadence, Incentia, Magma, Mentor, Synopsys or Synplicity and enables a one-pass RTL to GDSII synthesis flow. It also eases overall design floor planning.
TurboBIST family of products from SynTest Technologies, Inc. includes tools for logic (TurboBIST - Logic) and memory (TurboBIST - Memory) (SRAM, ROM, DRAM and CAM) built-in self-test. These tools synthesize the BIST logic surrounding functional logic and memory blocks, including IP cores from third party suppliers, and automatically generate the test patterns needed to provide very high fault coverage testing of complete complex system-on-silicon chips.
TurboFault combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs). TurboFault reads Verilog gate-level netlists, and will also read Standard Delay Format (SDF) timing files.
TurboCheck is a Testability Analyzer and Test Assistant for both RTL (Register-Transfer-Level) and gate-level digital designs. TurboCheck analyzes the testability of sequential circuits and assists the designer in selecting test solutions that are most likely to improve the circuit's final fault coverage. TurboCheck operates on non-scan, partial-scan, or full-scan circuits. Because it is a static tool operating on the topology of the circuit, no vectors are needed for the analysis.TurboScan - Scan Synthesis and ATPG veiw data sheet
TurboScan is an advanced full-scan test suite. It includes a Scan Synthesizer (optional) and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable. The ATPG engine uses advanced search and compaction algorithms to achieve very high fault coverage and produce a very compact test pattern set. TurboScan is designed to reduce product defect level and save test costs.
TurboBSD - Boundary Scan view data sheet
TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns. All these tasks are fully automated by the tool, making boundary scan design a straightforward process.
TurboDFT - Integration Tool Suite view data sheet
TurboDFT contains a suite of very useful and powerful DFT integration tools. TurboDFT allows users to automatically integrate and stitch DFT cores, whether they are created using DFT tools from SynTest or other vendors. Rtlmsdb scripts and commands are provided for allowing users to automatically stitch DFT cores with or without boundary-scan control. Thus, TurboDFT brings "Ease of integration" benefit and eliminates the tedious, error-prone manual stitching process.
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