SynTest continues to grow, opens 2nd R&D office in Taiwan SUNNYVALE, California, USA and HSINCHU, Taiwan.October 3, 2002 .SynTest Technologies, Inc., the leading supplier of DFT (Design for Test) tools and services for SOC (System On Chip) design, announced today that it has opened a 2nd office in Taiwan. The new office also located in the Sciencebased Industrial Park in Hsinchu, is focused on R&D for SynTest DFT and Design for Debug and Diagnosis (DFD) products. "The growing interest in our DFT products and services, and the continuing development and enhancement of our products requires that we continue to add to our R&D staff," noted Dr. L.-T. Wang, SynTest President and CEO. SynTest's offices in Taiwan are located at: 2F, No. 27, Industry East Road 9, Science-based Industrial Park, Hsinchu, Taiwan and 2F, No. 13, Industry East Road 2, Science-based Industrial Park, Hsinchu, Taiwan. Earlier this year, SynTest expanded its Sunnyvale headquarters to accommodate new staff and opened a support center in Yokohama, Japan. About SynTest SynTest Technologies, Inc. develops and markets advanced Design For Test (DFT) and Design For Debug/Diagnosis (DFD) tools to semiconductor companies, ASIC designers and test groups throughout the world. Headquartered in Sunnyvale, California, the company has offices in Taiwan, Korea and Japan. The company's products improve an electronic design's testability and fault coverage, and result in reduced defect levels, reduced costly tester time, and reduced slippage in time-to-market. These products include tools for built-in self-test (BIST) for logic and memory, boundary-scan synthesis, DFT testability analysis, scan synthesis, automatic test-program generation (ATPG), concurrent fault simulation, silicon debug and diagnosis. More information is available at www.syntest.com. SynTest Technologies Inc. is headquartered at 505 South Pastoria Ave., Suite 101, Sunnyvale, California 94086, Phone: 408-720-9956, E-Mail: info@syntest.com Notes to editors: All tradenames and trademarks are the property of their respective owners. Acronyms: ASIC: Application Specific Integrated Circuit BIST: Built In Self-Test DFD: Design for Debug/Diagnosis DFT: Design for Test SOC System On Chip For Immediate Release Press Contact: Georgia Marszalek, ValleyPR for SynTest, 650-345-7477, Georgia@ValleyPR.com