What some of our customers say
BAY MICROSYSTEMS, USATony Chiang, Vice President of Engineering at Bay Microsystems said, "We are very happy with our choice of SynTest, as our DFT partner. By providing exemplary DFT services, and installing their tools at our site, they enabled us to test various modules on command, drastically reducing down time and maximizing our productivity. The compact ATPG patterns generated by SynTest's TurboScan-ATPG software allowed us to reduce time-to-market. using ATE to test the structural reliability of our chip design."
CHIPX, USA"We pride ourselves on offering our customers the lowest cost ASIC solutions and getting them to market faster than any other ASIC alternative", said Elie Massabki, Vice President of Marketing at ChipX. "Upgrading our Design for Test (DFT) tools with VirtualScan™ from SynTest is an important step towards our on-going effort to consistently upgrade our development and test capabilities with the most effective tools to service our customers."
"We use Syntest and are very happy with the tools. There are sometimes frustrating moments, but have been very happy with the Syntest customer support and the results."
Nicco Bhabu, Chip Express, in SNUG.
(DAC 03 Item 20) ----------------------------------------------- [ 01/20/04 ] - Deepchip
UNIVERSAL MACHINES, USA
"We have used SynTest TurboBIST-Logic, the TurboBIST-Memory and the TurboBSD, and SynTest Consulting Services in one of our large and complex designs. This particular design has about 12 million gates, many memory modules, and with more than 8 clock domains.
We were very happy with SynTest DFT tools because their tools and tool flows were integrated and worked well with our existing design environment. Their tools successfully produced the required intended test hardware and software for our products.We were also very pleased with the SynTest Consulting Team. They supported and trained our design team in the DFT implementation phase"
Ken Choi, Director VLSI Design, Universal Machines, Inc., California
SANYO, JAPAN"We consider TurboFault to be a very effective tool for very fast fault simulation of multi-million gate SoC designs," said Mr. K. Murawaki, Senior Manager of Sanyo Semiconductor Company.
Mr. Ohnishi, Manager of Sanyo Semiconductor Company noted, "TurboFault's processing time is shorter than other tools and we believe it is the only tool that provides fault coverage for multi-million gate LSI designs. It is also quite useful for generating high fault coverage test vectors in the earliest stage of the design."Mr. K. Yamamura, Senior Staff of Sanyo Semiconductor Company, commented "We are impressed not only by SynTest's technology but also by its support."
VIA, TAIWAN
Benjamin Chiu, Section Manager of Design Methodology at VIA, noted, "Our experience with the past several designs has proven the value and usefulness of SynTest's complete suite of DFT, BIST, scan synthesis and ATPG tools. They fit very well into our flow and out-perform any other tools available in the marketplace today."
LG ELECTRONICS INC., KOREA
Dr, Woo-Hyun Paik, Group Leader/Chief Research Engineer at System IC Division, LG Electronics, Inc. said, "VirtualScan product from SynTest for test compression delivers predictable compression ratio, has a negligible area overhead, and still employs the existing ATPG flow for ease of implementation. With production proven parts in our hands, we are impressed with the test cost reduction VirtualScan delivers."
For web-site related inquiries, comments, and bug reports, please email webmaster@syntest.com
For technical support questions and product information, please contact support@syntest.com
Copyright 1999 SynTest, Inc. All Rights Reserved.
All trademarks and registered trademarks are the property of their respective companies.