| For Release October
10, 2001 at Fabless Semiconductor Association Suppliers Expo Press Contacts: Herman So, Avalent Technologies, Inc., 408-435-1188 x103, herman@avalent.com Georgia Marszalek, ValleyPR for SynTest, 650-345-7477, georgia@valleypr.com www.avalent.com
SynTest's
ATPG and BIST Tools Reduce Defect Level and Tester Time for SoCs That
Use Santa Clara, California, October 10, 2001 -- FSA Suppliers Expo -- Avalent Technologies, Inc. of San Jose, California today announced that it has standardized on DFT tools from SynTest Technologies, Inc. of Sunnyvale, California to improve the testability of SoCs using Avalent's high-performance, high-density ASIC cores. The SynTest tools allow Avalent licensees to improve testability and fault coverage and reduce defect levels and tester time. Avalent customers are using SynTest's, Turbo-Scan-ATPG(TM) and TurboBIST-Memory(TM) tools to improve their system's testability. Avalent selected SynTest's
TurboBIST for its ASIC embedded memory testing and SynTest's DFT tools
for generating design dependent test patterns for manufacturing. For Avalent's
ASICs with its reconfigurable architecture and re-programmability, the
number of test vectors is reduced significantly. Benchmarks show that
for a typical ASIC-based SoC design, there can be more than a 60% reduction
in the number of manufacturing test vectors required for 98% test coverage.
Mr. So added, " SynTest's tools fit very well in the standard ASIC flow used by our customers." L.-T. Wang, SynTest president, noted, " Avalent has superior technology for advanced ASICs. Their customers have the advantage of using our full scan and memory BIST products to make their designs more testable and reduce their tester costs." About Avalent Technologies About SynTest Acronyms: TurboBIST-LOGIC, TurboBIST-Memory, and TurboScan are trademarks of SynTest Technologies, Inc. All other trademarks are the property of their respective owners. |